I7: Lowering Occupational Exposure Limits and IH Method Capability

Greater Columbus Convention Center 

Room: A 210 

CM Credit Hours: 1 

As Occupational Exposure Limits (OELs) keep decreasing (e.g., TLVs, WEELS) and new limits are introduced (e.g., EPA Existing Chemical Exposure Limits or ECELs), it is important to ensure that IH sampling and analytical methods are capable of detecting below these new, lower OELs. This is essential to ensure our exposure assessment and control strategies are effective and workers are protected. This presentation will describe a step-wise approach that can be used to evaluate OELs against current monitoring methods and analytical lab capabilities. The aim is to determine if these methods are effective or if changes are needed to improve sensitivity to meet the new, lower OEL. Discussions will include: a) the advantages of moving from active to passive sampling; b) limits of detection differences between labs; c) simple analytical method extensions; d) complex method extensions (e.g., mass spectroscopy); using different detectors; and e) new sampling technologies (e.g., thermal desorption). Information will be presented that describes how an IH professional can perform simple calculations to determine if their method is adequate for the lower OEL and if not, what actions can be taken to improve method sensitivity. Participants should be able to assess OELs and current lab capabilities to determine if analytical detection limits for the IH method can be lowered to meet a new, lower OEL.

Upon completion, the participant will be able to:

• Conduct calculations to determine if an existing method can meet lowered OELs.
• Identify and request necessary method modifications to meet lowered OELs.
• Discuss the sensitivity limitations for commonly used analytical equipment.
• Apply knowledge gained to manage IH sampling programs and lab selections. 

Introductory

Q&A

Quiz

Corporation/Company

All Industries

Available as part of AIHA CONNECT OnDemand

Hazard Recognition/Exposure Assessment

Sampling and Analysis