IS1: Measuring What's Been Hard to Measure: New UFP Monitoring Approaches - TSI Inc.

Jonny Myers Presenter
TSI Incorporated
Shoreview, MN 
USA
 
Mon, 6/1: 11:45 AM - 12:10 PM CDT
Innovation Stations 
Ernest N. Morial New Orleans Convention Center 
Room: Exhibit Hall, Booth 1716 

Description

Having trouble capturing ultrafine particle exposures outside fixed monitoring locations? Learn why real world UFP monitoring has been challenging—and how portable solutions integrated with the OmniTrak™ platform help professionals collect, view, and compare exposure data across environments to support clearer understanding and more confident decisions.

Session Availability

In-person
OnDemand
Virtual