IS1: Measuring What's Been Hard to Measure: New UFP Monitoring Approaches - TSI Inc.
Jonny Myers
Presenter
TSI Incorporated
Shoreview, MN
USA
Mon, 6/1: 11:45 AM - 12:10 PM CDT
Innovation Stations
Ernest N. Morial New Orleans Convention Center
Room: Exhibit Hall, Booth 1716
Having trouble capturing ultrafine particle exposures outside fixed monitoring locations? Learn why real world UFP monitoring has been challenging—and how portable solutions integrated with the OmniTrak™ platform help professionals collect, view, and compare exposure data across environments to support clearer understanding and more confident decisions.
Session Availability
In-person
OnDemand
Virtual
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